Zayachuk, D.M.; Buga Csaba; Slynko, V.E.; Csík Attila

MATERIALS TODAY: PROCEEDINGS, Volume 35, Part 4, 2021, Pages 513-517

DOI: https://doi.org/10.1016/j.matpr.2019.10.011

Published: 29 October 2019

Abstract

We review, summarize and augment our recent studies on the problem of using Secondary Neutral Mass Spectrometry method for analyzing PbTe, SnTe and GeTe binary tellurides specimens. The experimental results are discussed with reference to the chemical diversity of the studied compounds, preferential sputtering of their constituents manifesting itself differently in the different tellurium compounds; the large differences in atomic masses of the telluride components; and the morphology of the sputtered surfaces, which has been characterized by means of scanning electron microscopy.