Röntgendiffraktométer
INFRASTRUKTÚRA
X Ray diffraction is a non destructive analysis method for characterization of any materials including metals, minerals, plastics, pharmaceuticals and semiconductors.
With currently available system (Rigaku SmatLab 9 kW and Siemens 3 kW CuK X ray source) it is possible to perform scans on diferent geometry.
![img-4516](https://mslab.atomki.hu/wp-content/uploads/sites/8/2020/08/img-4516.jpg)
![img-4522](https://mslab.atomki.hu/wp-content/uploads/sites/8/2020/08/img-4522.jpg)