Scanning Probe Microscopies (SPM)

INFRASTRUCTURE

The SPECS SPM 150 Aarhus with ultimate atomic performance allows scientists to observe processes on surfaces on a nanometer scale.

The miniaturized design, with a smallest mechanical loop between tip and surface, results in extreme stability unique to the SPM market. Fast scan rates are achieved by high resonant frequencies of this scanner head design. The SPECS SPM 150 Aarhus is equipped with a fast and fully automatically controlled approach mechanism. The tip (either an STM tip or the tip mounted on the KolibriSensor®) may be cleaned by parallel ion beam etching, field emission or short voltage pulses with no necessity for tip/sensor replacement as in other SPMs. The STM 150 Aarhus, which serves as the platform for the SPM 150 is being exclusively produced and marketed by SPECS GmbH. Furthermore, the SPM 150 Aarhus is optimized for the application of the the novel KolibriSensor® for state-of-the-art noncontact atomic force microscopy (NC-AFM) which enables atomic resolution studies on insulating substrates.

Scanning Tunnel Microscopy (STM)

In the case of STM, an electric current flows through the probe (pointed metal or semiconductor needle) into the sample or in the opposite direction. Nanotechnology has become a new branch of science with the invention of STM. By being able to map surfaces on the atomic scale and perform interventions with the same precision, it has become a defining element of the toolbox of modern solid state physics.

Atomic Force Microscopy (AFM)

The AFM probe is also a pointed but not necessarily metal or semiconductor needle. In this case, the force between the needle and the sample is measured.

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